Over the last decade high resolution x ray diffractometry and topography have played a vital role in providing a better understanding of thin film materials and the development of high quality crystals for devices as the importance of high quality thin films and multilayer structures continues to grow more and more scientists and engineers have found that a knowledge of high resolution x . Table of contents introduction diffraction studies of crystal perfection high resolution x ray diffraction techniques analysis of expitaxial layers x ray scattering theory simulation of x ray diffraction rocking curves analysis of thin films and multiple layers triple axis x ray diffractometry single crystal x ray topography double crystal x ray topography synchrotron radiation . Introduction high resolution x ray diffractometry and topography are now widely accepted techniques for the study of small strains in highly perfect crystals they differ in that diffractometry ex amines as a function of angle the variation of the total scattered intensity from the area of sample illuminated by the x ray beam which may itself be conditioned by one or more bragg reflection . This book explores the area of x ray diffraction and the techniques available for deployment in research development and production it maps the theoretical and practical background necessary to study single crystal materials using high resolution x ray diffraction and topography it combines mathematical formalism with graphical explanations and hands on advice for interpreting data thus